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Emission Intensity of Single-walled Nanotubes Plotted as a Surface Graph

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When a sample of single-walled nanotubes is examined by spectrofluorimetry, emission intensity can be plotted as a function of excitation and emission wavelengths to give a surface plot, where each peak corresponds to a different semiconducting nanotube structure.

Read the entire article on The Industrial Physicist web site.

Prof. R. Bruce Weisman
Rice University
P.O. Box 1892
Houston, TX 77251 USA

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