Description:
When a sample of single-walled nanotubes is examined by spectrofluorimetry, emission intensity can be plotted as a function of excitation and emission wavelengths to give a surface plot, where each peak corresponds to a different semiconducting nanotube structure.
Read the entire article on The Industrial Physicist web site.
Prof. R. Bruce Weisman
Rice University
P.O. Box 1892
Houston, TX 77251 USA